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Royce Instruments
Nanofabrication
Overview
Core Nanofabrication
Photolithography
Wet Processing
Metrology, Inspection and Testing
Deposition of Metals
Dry Etching
Dielectric Deposition
Wafer Cleaving and Sawing
Processing of Organic Semiconductor Materials
Electron-beam Lithography
Leica VB6
RAITH
Growth
III-V Growth
Topological Materials Growth
Characterisation
Overview
3D Imaging Centre
Atom Scattering
SpinEcho
A-SHeM
B-SHeM
Miniscat
Electron Ion Beam Microscopy
Helios 600 i
Hitachi 5500
Hitachi SU 8600
XPS
Escalab 250Xi
NEXSA G2
SPECS NAP-XPS
Research Support
Overview
Technical Services
Events and Courses
Home
About
About CORDE
People
Acknowledging CORDE
Getting Access
Access and Payment
Equipment Directory
Plan Your Visit
Contact Us
Funding
Booking System (Existing Users)
Royce Instruments
Nanofabrication
Overview
Core Nanofabrication
Photolithography
Wet Processing
Metrology, Inspection and Testing
Deposition of Metals
Dry Etching
Dielectric Deposition
Wafer Cleaving and Sawing
Processing of Organic Semiconductor Materials
Electron-beam Lithography
Leica VB6
RAITH
Growth
III-V Growth
Topological Materials Growth
Characterisation
Overview
3D Imaging Centre
Atom Scattering
SpinEcho
A-SHeM
B-SHeM
Miniscat
Electron Ion Beam Microscopy
Helios 600 i
Hitachi 5500
Hitachi SU 8600
XPS
Escalab 250Xi
NEXSA G2
SPECS NAP-XPS
Research Support
Overview
Technical Services
Events and Courses
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